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Issue DateTitleAuthor(s)
2009Harran ovası koşullarında farklı sulama miktarlarının ve fosfor magnezyum dozlarının soyada (Glycine max. L.) verim ve kalite unsurları üzerine etkisi / Amounts of water, phosphorus, and magnesium applications on the yield and quality of soy beans (Glycine max. L.) grown in southeast TurkeyDELİBORAN, AİŞE
2009Şanlıurfa yöresindeki küçükbaş hayvanların filogenetik yapılarının moleküler tekniklerle belirlenmesi çalışmaları / Studies on phylogenetic profiles of small ruminant animals in Sanliurfa region using molecular techniquesKİRAZ, SELAHADDİN
2009Farklı bitki sıklığı ve mepiquat chloride uygulamasının normal ve geç ekimlerde pamuğun (Gossypium hirsutum L.) verim ve verim unsurlarına etkisi / The effect of different plant densities and mepiquat chloride applications on cotton (Gossypium hirsutum L.) yield and yield components in normal and late planting periodsBEYYAVAŞ, VEDAT
2009Makarnalık buğdayda bazı kalite ve verim ile ilişkili karakterlerde genetik analizler / Genetic analyses of characteristics related with yield and some quality in durum wheatCOŞKUN, YALÇIN
2009Krem yapılı antepfıstığı ezmesi üretiminde antepfıstığı miktarının ve depolama koşullarının ürün kalitesi üzerine etkileri / The effects of the pistachio quantity and the storage conditions on the quality of the spreadable pistachio nut pasteGAMLI, ÖMER FARUK
2009Şanlıurfa ili biber alanlarında tütün etch virüsü (TEV)'nün yabancı ot konukçularının saptanması / The determination of tobacco etch virus (TEV) on weed plants in pepper fields in ŞanliurfaOKUYAN, CEYDA
2009Microsatellit (SSR) DNA markörlerinin mercimek genom haritalamasında kullanılması / Use of SSR (microsateliite) markers in construction of genetic linkage map of lentilVARLI, İBRAHİM
2009In this study chemical solutions of BaTiO3, SrTiO3, BaZrO3, ZnTiO3, ZrTiO4, ZrO2, La1/3Ca2/3MnO3, La1/3Ba2/3MnO3 and La1/3Sr2/3MnO3 were prepared by sol?gel method using metal alkoxides. And these solutions were coated on Ag, steel, Cu and glass by dipcoating method to produce thin films. Thin films were annealed at 600ºC-700ºC temperatures. X-ray diffraction (XRD) showed that the crystal structure was occured. Thickness of thin films was measured by spectroscopic elipsometer and micrometer. Thickness of thin films was found as 40-80 µm and 300-700 nm. Capacitance of BaTiO3, SrTiO3, BaZrO3, ZnTiO3, ZrTiO4, ZrO2 , La1/3Ca2/3MnO3, La1/3Ba2/3MnO3 and La1/3Sr2/3MnO3 thin films were measured by capacitometer. And coated surface areas were calculated and dielectric constant of these films were found using measurement system of capacitance.KÜP, FERHAT
2009TDR cihazının kalibrasyonunun yapılması ve sulama otomasyonuna uygun hale getirilmesi / TDR calibration of the tdr device and its optimisation for irrigation automationsKÜP, FERHAT
2009Dikdörtgen kesitli yığma kolonların yatay yerdeğiştirme rijitliklerinin belirlenmesi / Determination of the lateral stiffness of unreinforced masonry rectangle columnsŞENOCAK, AYTEN